SPEAKER: G.A. Botton
Dept of Materials Science and Engineering,
Canadian Centre for Electron Microscopy- Brockhouse Institute for Materials Research
TITLE:
DATE: March 10 2011
TIME: 10:30 am
PLACE: JHE 326H
ABSTRACT
Electron microscopy is an invaluable tool to study the detailed structure of materials. Many of the analytical methods available in the transmission electron microscope provide detailed compositional and spectroscopic information with unprecedented spatial resolution.
Various examples of applications of electron microscopy will be given in this presentation. After an overview of the methods and the recent developments in aberration-corrected microscopy, the presentation will discuss detailed studies of quantitative electron microscopy of compositional modulations and strain analysis in nanowires and the study of interfaces between III-V compounds and Si. Results demonstrate the chemical distribution measurements with better than 0.2nm spatial resolution. Several examples highlight the application of microscopy technique to the analysis of alloy and core-shell nanoparticles, carbon nanotubes functionalized or filled with polymers, interfaces in complex oxides, 3D microscopy of catalysts used in heavy oil refining, bones and interfaces between bones and biomaterials. These examples demonstrate that compositional and chemical state (valence and coordination) information can be obtained down to the Ångstrom level. The current status of the Canadian Centre for Electron Microscopy will be presented.